Educational content :

• Measuring indices of metal - aluminum (n and k),
• Principle of ellipsometry, ellipsometry by extinction
  
• Polarization of light, identification of fast and slow axes of a plate Determination of the ellipsometric angles of a material
  
• Measuring refractive indices of a silicon substrate (n, k)
  
• Index measurement (n) and thickness (e) a monolayer of SiO₂ on silicon substrates
• Measure index glass (n, k)
  
• Study the consequences of a change in the angle of incidence on the indices of a sample
  
• Studying the effect of changing wavelength on n and e
  
• Highlighting the influence of measurement error on the values of n, k and e.